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Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI

Abstract : Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence measurements are reported and discussed in the frame of comparisons between Synopsys code simulations and experimental results.
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http://hal.in2p3.fr/in2p3-00293365
Contributor : Pascale Chambon <>
Submitted on : Friday, July 4, 2008 - 11:59:07 AM
Last modification on : Thursday, January 11, 2018 - 6:12:51 AM

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A. Torres, J.E. Sauvestre, B.E. Fischer, P. Barberet. Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2005, pp.PG1-1-PG1-5. ⟨10.1109/RADECS.2005.4365610⟩. ⟨in2p3-00293365⟩

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