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Use of a nuclear microprobe in electronic device characterization

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http://hal.in2p3.fr/in2p3-00321170
Contributor : Ludovic Le Noan <>
Submitted on : Friday, September 12, 2008 - 3:10:49 PM
Last modification on : Thursday, January 11, 2018 - 6:12:50 AM

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H. Guégan. Use of a nuclear microprobe in electronic device characterization. Electronic Device Failure Analysis, 2007, 9, pp.14-19. ⟨10.1361/edfa0904p14⟩. ⟨in2p3-00321170⟩

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