Use of a nuclear microprobe in electronic device characterization

H. Guégan

doi:10.1361/edfa0904p14

Journal articles

Use of a nuclear microprobe in electronic device characterization

H. Guégan ¹

1 CENBG - Centre d'Etudes Nucléaires de Bordeaux Gradignan

Document type :

Journal articles

Domain :

Physics [physics] / Physics [physics] / Instrumentation and Detectors [physics.ins-det]

Complete list of metadatas

http://hal.in2p3.fr/in2p3-00321170
Contributor : Ludovic Le Noan <>
Submitted on : Friday, September 12, 2008 - 3:10:49 PM
Last modification on : Thursday, January 11, 2018 - 6:12:50 AM

Use of a nuclear microprobe in electronic device characterization

Identifiers

Collections

Citation

Export

Metrics

45

Use of a nuclear microprobe in electronic device characterization

Identifiers

Collections

Citation

Export

Share

Metrics

45