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Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI

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http://hal.in2p3.fr/in2p3-00337536
Contributor : Ludovic Le Noan <>
Submitted on : Thursday, November 13, 2008 - 10:08:02 AM
Last modification on : Thursday, January 11, 2018 - 6:12:51 AM

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  • HAL Id : in2p3-00337536, version 1

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A. Torres, J.E. Sauvestre, B.E. Fischer, Ph. Barberet. Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI. 8th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2005), Sep 2005, Cap d'Agde, France. ⟨in2p3-00337536⟩

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