Influence of crystal-orientation effects on pulse-shape-based identification of heavy-ions stopped in silicon detectors

Abstract : Current and charge signals have been collected for Se ions at 408 MeV, S at 160 MeV and Ni at 703 MeV, all stopped in silicon detectors. Some detectors were cut 0ring operator off the View the MathML source axis and some off the View the MathML source axis. Important effects on the shape of the silicon current and charge signals have been observed, depending on the orientation of the impinging ion relative to the crystal axes and planes. A degradation of the energy and risetime resolution of about a factor not, vert, similar3 with respect to the measured optimal values (for example 7ring operator off-axis orientation) is observed for ion impinging directions close to crystal axes and/or planes, i.e. the common scenario for normal incidence on 0ring operator cut detectors. For Pulse Shape Analysis applications, the necessity of using such “random” oriented silicon detectors is demonstrated.
Document type :
Journal articles
Complete list of metadatas

http://hal.in2p3.fr/in2p3-00397120
Contributor : Sandrine Guesnon <>
Submitted on : Friday, June 19, 2009 - 3:42:04 PM
Last modification on : Tuesday, February 19, 2019 - 9:44:03 AM

Identifiers

Citation

L. Bardelli, M. Bini, G. Casini, G. Pasquali, G. Poggi, et al.. Influence of crystal-orientation effects on pulse-shape-based identification of heavy-ions stopped in silicon detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2009, 605, pp.353-358. ⟨10.1016/j.nima.2009.03.247⟩. ⟨in2p3-00397120⟩

Share

Metrics

Record views

159