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Photon, Electron, and Secondary Ion Emission from Single C60 keV Impacts

Abstract : This Letter presents the first observation of coincidental emission of photons, electrons, and secondary ions from individual C60 keV impacts. An increase in photon, electron, and secondary ion yields is observed as a function of C60 projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV−Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution.
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Submitted on : Thursday, February 3, 2011 - 4:45:51 PM
Last modification on : Wednesday, September 16, 2020 - 4:08:30 PM

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F.A. Fernandez-Lima, M.J. Eller, S.V. Verkhoturov, S. Della-Negra, E. A. Schweikert. Photon, Electron, and Secondary Ion Emission from Single C60 keV Impacts. Journal of Physical Chemistry Letters, American Chemical Society, 2010, 1, pp.3510-3513. ⟨10.1021/jz1014345⟩. ⟨in2p3-00562623⟩

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