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Nanometer Order of Stabilization for Precision Beam Size Monitor (Shintake Monitor)

Abstract : A precision beam size monitor using interference fringes as a reference called Shintake monitor[1] has been developed. Relative position between the beam and the interference fringes should be stabilized within few nm to measure the beam size of 37 nm with resolution of better than 10%. This paper presents concept and performances for stabilization of the Shintake monitor with respect to vibrations. We stabilized the table for the interferometer using a method, "Rigid mount on floor", and the table motions relative to the floor are estimated to be 2 and 6 nm
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T. Kume, N. Terunuma, T. Tauchi, Y. Honda, S. Araki, et al.. Nanometer Order of Stabilization for Precision Beam Size Monitor (Shintake Monitor). Particle Accelerator Conference (PAC09), May 2009, Vancouver, Canada. pp.TH5RFP084. ⟨in2p3-00590505⟩

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