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Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

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http://hal.in2p3.fr/in2p3-00609765
Contributor : Sylvie Flores <>
Submitted on : Wednesday, July 20, 2011 - 8:29:47 AM
Last modification on : Friday, April 24, 2020 - 10:28:04 AM

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C. Ray, A. Bräuning-Demian, H. Bräuning, M. Chevallier, C. Cohen, et al.. Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical Review B: Condensed Matter and Materials Physics, American Physical Society, 2011, 84, pp.024119. ⟨10.1103/PhysRevB.84.024119⟩. ⟨in2p3-00609765⟩

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