Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

  C. Ray ¹ AuthorId : 31950
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  A. Bräuning-Demian AuthorId : 61479
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  H. Bräuning AuthorId : 61483
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  M. Chevallier ² AuthorId : 679007
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  C. Cohen ³ AuthorId : 10168
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  D. Dauvergne ¹ AuthorId : 10166

Author IdHAL : denis-dauvergne ResearcherId : http://www.researcherid.com/rid/H-8484-2018 ORCID : https://orcid.org/0000-0002-6190-6311

  A. l'Hoir ³ AuthorId : 10171
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  C. Kozhuharov AuthorId : 5766
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  D. Liesen AuthorId : 36087
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  P. H. Mokler AuthorId : 58812
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  J.-C. Poizat ¹ AuthorId : 6659
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  Th. Stöhlker AuthorId : 61480
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  E. Testa ¹ AuthorId : 36090
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  M. Toulemonde AuthorId : 5325
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