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Grain growth and structural transformation in ZnS nanocrystalline thin films

S.P. Patel J.C. Pivin 1 V.V.S. Kumar A. Tripathi D. Kanjilal L. Kumar
1 CSNSM PCI
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
Abstract : Fabrication of ZnS thin films having similar stoichiometry at different substrate temperatures (T(s)) e.g. 200 degrees C, 300 degrees C and 400 degrees C by means of RF magnetron sputtering method is presented. The films grown at Ts of 200 degrees C are in cubic zinc-blende phase and textured along (111) plane. The films deposited at T(s) of 300 degrees C and 400 degrees C are in hexagonal wurtzite phase. The surface roughness and grain size of the films increase with increasing T(s), The ultra-violet and visible absorption studies show that the bandgap of films can be tailored by varying T(s), taking advantage of the structural transformation. (C) 2010 Elsevier Ltd. All rights reserved.
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Submitted on : Friday, July 22, 2011 - 4:30:22 PM
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S.P. Patel, J.C. Pivin, V.V.S. Kumar, A. Tripathi, D. Kanjilal, et al.. Grain growth and structural transformation in ZnS nanocrystalline thin films. Vacuum, Elsevier, 2010, 85, pp.307-311. ⟨10.1016/j.vacuum.2010.06.011⟩. ⟨in2p3-00610608⟩

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