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A noninterceptive heavy ion beam profile monitor based on residual gas ionization

Abstract : At GANIL we have developed a beam profile monitor based on ionization of the residual gas of the beam transport lines under the impact of high energy heavy ion beams. The charged ions of the residual gas drift by means of an electrostatic field onto a microchannel plate (MCP), which yields'signals collected on a multistrip anode, providing the spatial distribution of the beam. Calculations and results are presented as well as discussions about the different parameters of the device .
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http://hal.in2p3.fr/in2p3-00612055
Contributor : Michel Lion <>
Submitted on : Thursday, July 28, 2011 - 9:42:32 AM
Last modification on : Thursday, February 1, 2018 - 1:34:15 AM

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R. Anne, Y. Georget, R. Hue, C. Tribouillard, J.L. Vignet. A noninterceptive heavy ion beam profile monitor based on residual gas ionization. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1993, 329, pp.21-28. ⟨10.1016/0168-9002(93)90918-8⟩. ⟨in2p3-00612055⟩

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