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Softening of phonons by lattice defects and structural strain in heavy ion irradiated nanocrystalline zinc oxide films

Abstract : Origin of the Raman mode in nanocrystalline zinc oxide in the vicinity of A(1) (LO) phonon mode induced by energetic heavy ions is reported. The evolution of this mode in the irradiated films is ascribed to the effect of disorder and the high density of lattice defects induced by irradiation. The presence of such defects is confirmed by the reduction in the intensity of E(2) (high) mode and band bending of the near band edge absorption. A softening of the evolved Raman mode with increasing in ion fluence is also observed. This softening cannot be attributed to spatial confinement of phonons, as the sizes of the crystallites are large. Therefore, it is explained in terms of the combined effects of phonon localization by lattice defects and the structural strain in the lattice induced by electronic energy loss transferred by energetic heavy ions.
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Submitted on : Wednesday, November 30, 2011 - 9:43:24 AM
Last modification on : Wednesday, September 16, 2020 - 4:17:32 PM

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F. Singh, R. G. Singh, V. Kumar, S.A. Khan, J. C. Pivin. Softening of phonons by lattice defects and structural strain in heavy ion irradiated nanocrystalline zinc oxide films. Journal of Applied Physics, American Institute of Physics, 2011, 110, pp.083520. ⟨10.1063/1.3651638⟩. ⟨in2p3-00646497⟩

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