Skip to Main content Skip to Navigation
Journal articles

XRD contribution to the study of Cs-implanted cubic zirconia

Abstract : The radiation-induced damage in Cs-implanted cubic zirconia at room temperature has been investigated as a function of the fluence (from a few 10(13) to a few 10(16) cm(-2)) by means of XRD measurements. These experiments allowed determining the maximum strain and stress experienced by the damaged layers as well as the strain depth profiles. The radiation-induced elastic strain. localized along the direction normal to the implanted sample surface, is positive. It induces an in-plane compressive stress which reaches -1.6 GPa before relaxation. This strain essentially comes from ballistic collisions generating interstitial-type defects, but a contribution due to Cs incorporation into the matrix should also be taken into account. XRD data have been confronted to results previously obtained by RBS/C and TEM experiments. A strong correlation between the evolution of the normal strain and of the disorder level measured by RBS/C is clearly established. In particular, the relaxation of the stored elastic strain takes place concomitantly with the microstructural evolution evidenced by the RBS/C damage build-up and imaged by TEM. Besides, the width of the strain depth profiles indicates that the strained layer is broader than the damaged thickness revealed by RBS/C and TEM analyses. (C) 2009 Elsevier B.V. All rights reserved.
Complete list of metadatas
Contributor : Christine Hadrossek <>
Submitted on : Wednesday, February 15, 2012 - 9:15:29 AM
Last modification on : Wednesday, September 16, 2020 - 4:17:40 PM




A. Debelle, A. Declemy, L. Vincent, F. Garrido, L. Thome. XRD contribution to the study of Cs-implanted cubic zirconia. Journal of Nuclear Materials, Elsevier, 2010, 396, pp.240-244. ⟨10.1016/j.jnucmat.2009.11.016⟩. ⟨in2p3-00670140⟩



Record views