Skip to Main content Skip to Navigation
Conference papers

LSST camera readout chip ASPIC: test tools

Abstract : The LSST camera will have more than 3000 video-processing channels. The readout of this large focal plane requires a very compact readout chain. The correlated ''Double Sampling technique'', which is generally used for the signal readout of CCDs, is also adopted for this application and implemented with the so called ''Dual Slope integrator'' method. We have designed and implemented an ASIC for LSST: the Analog Signal Processing asIC (ASPIC). The goal is to amplify the signal close to the output, in order to maximize signal to noise ratio, and to send differential outputs to the digitization. Others requirements are that each chip should process the output of half a CCD, that is 8 channels and should operate at 173 K. A specific Back End board has been designed especially for lab test purposes. It manages the clock signals, digitizes the analog differentials outputs of ASPIC and stores data into a memory. It contains 8 ADCs (18 bits), 512 kwords memory and an USB interface. An FPGA manages all signals from/to all components on board and generates the timing sequence for ASPIC. Its firmware is written in Verilog and VHDL languages. Internals registers permit to define various tests parameters of the ASPIC. A Labview GUI allows to load or update these registers and to check a proper operation. Several series of tests, including linearity, noise and crosstalk, have been performed over the past year to characterize the ASPIC at room and cold temperature. At present, the ASPIC, Back-End board and CCD detectors are being integrated to perform a characterization of the whole readout chain.
Complete list of metadatas

http://hal.in2p3.fr/in2p3-00678908
Contributor : Sabine Starita <>
Submitted on : Wednesday, March 14, 2012 - 11:21:14 AM
Last modification on : Tuesday, December 15, 2020 - 4:03:14 AM

Links full text

Identifiers

Citation

P. Antilogus, Ph. Bailly, J. Jeglot, C. Juramy, H. Lebbolo, et al.. LSST camera readout chip ASPIC: test tools. Topical Workshop on Electronics for Particle Physics (TWEPP-11), Sep 2011, Vienna, Austria. pp.C02044, ⟨10.1088/1748-0221/7/02/C02044⟩. ⟨in2p3-00678908⟩

Share

Metrics

Record views

527