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Conference papers

Influence of beam conditions and energy for SEE testing

Abstract : The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
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Submitted on : Wednesday, May 9, 2012 - 4:39:32 PM
Last modification on : Wednesday, January 26, 2022 - 3:45:04 AM

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V. Ferlet-Cavrois, J.R. Schwank, S. Liu, M. Muschitiello, Th. Beutier, et al.. Influence of beam conditions and energy for SEE testing. 12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, Spain. pp.690-699, ⟨10.1109/RADECS.2011.6131365⟩. ⟨in2p3-00695719⟩



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