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Conference papers
Influence of beam conditions and energy for SEE testing
V. Ferlet-Cavrois
J.R. Schwank
S. Liu
M. Muschitiello
Th. Beutier
1
A. Javanainen
A. Hedlund
C. Poivey
A. Zadeh
R. Harboe-Sorensen
G. Santin
B. Nickson
A. Menicucci
C. Binois
1
D. Peyre
1
S.K. Hoeffgen
S. Metzger
D. Schardt
H. Kettunen
A. Virtanen
G. Berger
B. Piquet
2
J.C. Foy
2
M. Zafrani
P. Truscott
M. Poizat
F. Bezerra
3
1
Astrium [Toulouse] (31 rue des Cosmonautes, Z.I. du Palays, F-31402 Toulouse Cedex 4 - France)
2
GANIL - Grand Accélérateur National d'Ions Lourds (Bvd Henri Becquerel - BP 55027 - 14076 CAEN CEDEX 5 - France)
- CNRS - Centre National de la Recherche Scientifique : UPR3266 (France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DRF/GANIL (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
- IN2P3 - Institut National de Physique Nucléaire et de Physique des Particules du CNRS (France)
3
CNES - Centre National d'Études Spatiales [Toulouse] (18 avenue Edouard Belin 31401 Toulouse - France)
Abstract : The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
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Conference papers
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http://hal.in2p3.fr/in2p3-00695719
Contributor : Michel Lion <>
Submitted on : Wednesday, May 9, 2012 - 4:39:32 PM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM
Contributor : Michel Lion <>
Submitted on : Wednesday, May 9, 2012 - 4:39:32 PM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM
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- HAL Id : in2p3-00695719, version 1
- DOI : 10.1109/RADECS.2011.6131365
Citation
V. Ferlet-Cavrois, J.R. Schwank, S. Liu, M. Muschitiello, Th. Beutier, et al.. Influence of beam conditions and energy for SEE testing. 12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, Spain. pp.690-699, ⟨10.1109/RADECS.2011.6131365⟩. ⟨in2p3-00695719⟩
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