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Influence of beam conditions and energy for SEE testing

V. Ferlet-Cavrois J.R. Schwank S. Liu M. Muschitiello Th. Beutier 1 A. Javanainen A. Hedlund C. Poivey A. Zadeh R. Harboe-Sorensen G. Santin B. Nickson A. Menicucci C. Binois 1 D. Peyre 1 S.K. Hoeffgen S. Metzger D. Schardt H. Kettunen A. Virtanen G. Berger B. Piquet 2 J.C. Foy 2 M. Zafrani P. Truscott M. Poizat F. Bezerra 3
1 Astrium [Toulouse]
2 GANIL - Grand Accélérateur National d'Ions Lourds
3 CNES - Centre National d'Études Spatiales [Toulouse]
Abstract : The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
Keywords : specie effect SRAM ion beam energy Power MOSFETs
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Conference papers
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Submitted on : Wednesday, May 9, 2012 - 4:39:32 PM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM

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V. Ferlet-Cavrois, J.R. Schwank, S. Liu, M. Muschitiello, Th. Beutier, et al.. Influence of beam conditions and energy for SEE testing. 12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, Spain. pp.690-699, ⟨10.1109/RADECS.2011.6131365⟩. ⟨in2p3-00695719⟩

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