Comparison of charged particle identification using pulse shape discrimination and ΔE−E methods between front and rear side injection in silicon detectors

N. Le Neindre 1 R. Bougault 1 S. Barlini E. Bonnet B. Borderie 2 G. Casini A. Chbihi 3 P. Edelbruck 2 J.D. Frankland 3 D. Gruyer 3 E. Legouée 1 O. Lopez 1 P. Marini 3 M. Pârlog 1 G. Pasquali M. Petcu M.F. Rivet 2 F. Salomon E. Vient 1 R. Alba G. Baiocco L. Bardelli M. Bini R. Borcea M. Bruno S. Carboni M. Cinausero I. Cruceru M. Degerlier J.A. Dueñas K. Ga¸sior F. Gramegna A. Grzeszczuk M. Kamuda T. Kozik V. Kravchuk I. Lombardo C. Maiolino T. Marchi L. Morelli F. Negoita A. Olmi H. Petrascu S. Piantelli G. Poggi E. Rosato D. Santonocito G. Spadaccini A.A. Stefanini T. Twaróg M. Vigilante
1 LPCC - Laboratoire de physique corpusculaire de Caen
2 IPNO - Institut de Physique Nucléaire d'Orsay
3 GANIL - Grand Accélérateur National d'Ions Lourds
Abstract : The response of silicon-silicon-CsI(Tl) telescopes, developed within the FAZIA collaboration, to fragments produced in nuclear reactions 84Kr+120-124Sn at 35 A MeV, has been used to study ion identification methods. Two techniques are considered for the identification of the nuclear products in the silicon stages. The standard ΔE−E one requires signals induced in two detection layers by ions punching through the first one. Conversely, the digital Pulse Shape Analysis (PSA) allows the identification of ions stopped in the first silicon layer. The capabilities of these two identification methods have been compared for different mountings of the silicons, i.e. rear (particles entering through the low electric field side) or front (particles entering through the high electric field side) side injection. The ΔE−E identification method gives exactly the same results in both configurations. At variance, the pulse shape discrimination is very sensitive to the detector mounting. In case of rear side injection, the identification with the "energy vs. charge rise time" PSA method presents energy thresholds which are significantly lower than in the case of front side injection.
Type de document :
Article dans une revue
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2013, 701, pp.145-152. 〈10.1016/j.nima.2012.11.005〉
Liste complète des métadonnées
http://hal.in2p3.fr/in2p3-00753651
Contributeur : Sandrine Guesnon <>
Soumis le : jeudi 22 novembre 2012 - 11:26:32
Dernière modification le : jeudi 12 avril 2018 - 10:47:17
Document(s) archivé(s) le : samedi 23 février 2013 - 03:41:58

Fichier

Preprint.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

GANIL | IPNO | LPC-CAEN | IN2P3 | CEA | COMUE-NORMANDIE | LPCC-DTN | DSM-GANIL | CEA-DRF

Citation

N. Le Neindre, R. Bougault, S. Barlini, E. Bonnet, B. Borderie, et al.. Comparison of charged particle identification using pulse shape discrimination and ΔE−E methods between front and rear side injection in silicon detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2013, 701, pp.145-152. 〈10.1016/j.nima.2012.11.005〉. 〈in2p3-00753651〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

426

Téléchargements de fichiers

349

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD