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Superconductor-Insulator Transition in Amorphous NbxSi1-x Thin Films. Comparison between Thickness, Density of State and Microscopic Disorder

O. Crauste 1 F. Couëdo 1 L. Berge 2 C. Marrache 1 L. Dumoulin 1
1 CSNSM PS1
CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière, CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
2 CSNSM INSTR
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
Abstract : We report on the study of the Disordered-induced Superconductor-Insulator Transition (D-SIT) in NbxSi1-x thin films. These films, synthesized by electron-beam co-deposition, are continuous, amorphous, homogeneously disordered and structurally stable for a wide range of compositions, thicknesses and annealing temperature and thus particularly well suited for the study of D-SIT. We present an analysis of the D-SIT induced by three different parameters: the thickness, the Nb composition that changes the electronic density of states and the annealing temperature that changes the microscopic disorder. The annealing changes quantum interference patterns that decreases the local conductance. Our results show that the effect of the thickness on the destruction of superconductivity is very distinct from those of the composition or the annealing. We point out this material is particularly interesting to disentangle the effect of the parameters driving this quantum phase transition.
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Submitted on : Wednesday, May 22, 2013 - 3:31:18 PM
Last modification on : Wednesday, September 16, 2020 - 5:43:28 PM

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O. Crauste, F. Couëdo, L. Berge, C. Marrache, L. Dumoulin. Superconductor-Insulator Transition in Amorphous NbxSi1-x Thin Films. Comparison between Thickness, Density of State and Microscopic Disorder. 26th International conference on low temperature physics (LT26), 2011, Beijin, China. pp.022012, ⟨10.1088/1742-6596/400/2/022012⟩. ⟨in2p3-00824891⟩

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