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In situ TEM study of cubic zirconia implanted with caesium ions

A. Gentils 1 M.-O. Ruault 1 L. Thome 2
1 CSNSM PS2
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
2 CSNSM PCI
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
Abstract : In situ transmission electron microscopy (TEM) observations were performed on yttria-stabilized zirconia during caesium (Cs) ion implantation at room temperature. Apparition of defect clusters is observed. The concentration of the latter increased with the Cs ion fluence. Until the higher fluence (2 x 10(16) cm(-2)), nothing else was observed except the overlapping of these defect clusters. At the higher fluence, Cs ion implanted thin sample was annealed between 600 and 1200 K. Only the recrystallization of cubic zirconia occurs during annealing; no other compounds were formed. The TEM results are compared to previous results obtained from Rutherford backscattering and channelling ion beam analysis techniques. (C) 2008 Elsevier B.V. All rights reserved.
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Submitted on : Wednesday, June 12, 2013 - 2:34:07 PM
Last modification on : Wednesday, September 16, 2020 - 5:43:38 PM

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A. Gentils, M.-O. Ruault, L. Thome. In situ TEM study of cubic zirconia implanted with caesium ions. Journal of Nuclear Materials, Elsevier, 2008, 381, pp.297-301. ⟨10.1016/j.jnucmat.2008.09.002⟩. ⟨in2p3-00833328⟩

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