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Self-consistent isotopic comparative method used to determine dependence of secondary-ion yields on oxygen concentration in Si-O system up to 33 at%

J.C. Dupuy G. Prudon C. Dubois R. Koegler S. Akhmadaliev A. Perrat-Mabilon 1
1 Accélérateur
IPNL - Institut de Physique Nucléaire de Lyon
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http://hal.in2p3.fr/in2p3-00835579
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Submitted on : Wednesday, June 19, 2013 - 10:24:37 AM
Last modification on : Tuesday, November 19, 2019 - 2:39:21 AM

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J.C. Dupuy, G. Prudon, C. Dubois, R. Koegler, S. Akhmadaliev, et al.. Self-consistent isotopic comparative method used to determine dependence of secondary-ion yields on oxygen concentration in Si-O system up to 33 at%. Surface and Interface Analysis, Wiley-Blackwell, 2013, 45, pp.369-372. ⟨10.1002/sia.5108⟩. ⟨in2p3-00835579⟩

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