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Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission

Abstract : A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large signal caused by a single event transient (SET) in the photodiode.
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http://hal.in2p3.fr/in2p3-00849111
Contributor : Danielle Cristofol <>
Submitted on : Tuesday, July 30, 2013 - 11:25:19 AM
Last modification on : Thursday, January 18, 2018 - 1:55:55 AM

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S. Seif El Nasr-Storey, S. Detraz, P. Gui, M. Menouni, P. Moreira, et al.. Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission. 48th IEEE International Nuclear and Space Radiation Effects Conference (NSREC), Jul 2011, Las Vegas, United States. pp.3111-3117, ⟨10.1109/TNS.2011.2172632⟩. ⟨in2p3-00849111⟩

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