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Journal articles
Effect of annealing on the superconducting properties of a-NbxSi1-x thin films
Abstract : a-NbxSi1-x thin films with thicknesses down to 25 Å have been structurally characterized by transmission electron microscopy measurements. As-deposited or annealed films are shown to be continuous and homogeneous in composition and thickness, up to an annealing temperature of 500 ∘C. We have carried out low-temperature transport measurements on these films close to the superconductor-to-insulator transition (SIT) and shown a qualitative difference between the effect of annealing or composition and a reduction of the film thickness on the superconducting properties of a-NbSi. These results question the pertinence of the sheet resistance R□ as the relevant parameter to describe the SIT.
http://hal.in2p3.fr/in2p3-00851988
Contributor : Christine Hadrossek Connect in order to contact the contributor
Submitted on : Monday, August 19, 2013 - 2:52:17 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:06 PM
Contributor : Christine Hadrossek Connect in order to contact the contributor
Submitted on : Monday, August 19, 2013 - 2:52:17 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:06 PM
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