Skip to Main content Skip to Navigation
Journal articles

Effect of annealing on the superconducting properties of a-NbxSi1-x thin films

O. Crauste 1 A. Gentils 2 F. Couëdo 1 Y. Dolgorouky 1 L. Bergé 3 S. Collin 1 C. Marrache-Kikuchi 4 L. Dumoulin 4
2 CSNSM PS2
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
3 CSNSM INSTR
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
4 CSNSM PS1
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
Abstract : a-NbxSi1-x thin films with thicknesses down to 25 Å have been structurally characterized by transmission electron microscopy measurements. As-deposited or annealed films are shown to be continuous and homogeneous in composition and thickness, up to an annealing temperature of 500 ∘C. We have carried out low-temperature transport measurements on these films close to the superconductor-to-insulator transition (SIT) and shown a qualitative difference between the effect of annealing or composition and a reduction of the film thickness on the superconducting properties of a-NbSi. These results question the pertinence of the sheet resistance R□ as the relevant parameter to describe the SIT.
Complete list of metadatas

http://hal.in2p3.fr/in2p3-00851988
Contributor : Christine Hadrossek <>
Submitted on : Monday, August 19, 2013 - 2:52:17 PM
Last modification on : Wednesday, September 16, 2020 - 5:43:39 PM

Links full text

Identifiers

Collections

Citation

O. Crauste, A. Gentils, F. Couëdo, Y. Dolgorouky, L. Bergé, et al.. Effect of annealing on the superconducting properties of a-NbxSi1-x thin films. Physical Review B: Condensed Matter and Materials Physics, American Physical Society, 2013, 87, pp.144514. ⟨10.1103/PHYSREVB.87.144514⟩. ⟨in2p3-00851988⟩

Share

Metrics

Record views

134