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Modelling of the surface-event identification mechanism in Ge detectors equipped with NbSi thin films

E. Olivieri 1 L. Berge 2 M. Chapellier 2 S. Collin 2 Y. Dolgorouky 2 L. Dumoulin 2 A. Juillard 3 S. Marnieros 2 C. Nones 2
1 CSNSM PS1
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
Abstract : A new generation of germanium composite bolometers, equipped with NbSi thin films, has been developed in the framework of the EDELWEISS experiment, presenting impressive surface event identification capabilities and a substantial improvement in the background rejection of heat and ionization detectors. In this work we present a simple thermal model which explain the surface-event identification mechanism via NbSi thin films sensors.
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Submitted on : Monday, August 26, 2013 - 12:26:32 PM
Last modification on : Friday, June 18, 2021 - 3:39:59 AM

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E. Olivieri, L. Berge, M. Chapellier, S. Collin, Y. Dolgorouky, et al.. Modelling of the surface-event identification mechanism in Ge detectors equipped with NbSi thin films. Journal of Low Temperature Physics, Springer Verlag (Germany), 2008, 151, pp.884-890. ⟨10.1007/s10909-008-9760-3⟩. ⟨in2p3-00854123⟩

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