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Comparision of Xe migration in UO2 during thermal annealing and under irradiation

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http://hal.in2p3.fr/in2p3-00994922
Contributor : Sylvie Flores <>
Submitted on : Thursday, May 22, 2014 - 1:27:40 PM
Last modification on : Thursday, February 6, 2020 - 4:28:02 PM

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  • HAL Id : in2p3-00994922, version 1

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B. Marchand, N. Moncoffre, Y. Pipon, N. Bérerd, C. Garnier, et al.. Comparision of Xe migration in UO2 during thermal annealing and under irradiation. 17Th International Conference on Radiation Effects in Insulators, Jun 2013, Helsinki, Finland. ⟨in2p3-00994922⟩

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