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Signals Induced by Charge Carrier Trapping

Abstract : Cryogenic germanium detectors used in dark matter searches operate at ranges of low temperature < 100 mK and electric field ∼ 1 V/cm such that charge trapping in the bulk of the detector plays a significant role in the net charge collected following a particle interaction. It is shown that in EDELWEISS FID800 detectors, these trapped charges induce residual charge signals that perturb the measurement of the total charge, significantly degrading the energy resolution at high energy. It is also shown that, by reading out the signal on all the electrodes, it is possible to clearly identify these effects and correct the total charge measurement accordingly, resulting in a ∼ 30 % improvement of the resolution at high energy. This effect is demonstrated with data. A simple analytical model based on Shockley-Ramo's theorem is presented, whereby this effect is due to the position dependence of signals induced by trapped charges.
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http://hal.in2p3.fr/in2p3-01066225
Contributor : Dominique Girod <>
Submitted on : Friday, September 19, 2014 - 1:01:02 PM
Last modification on : Tuesday, November 19, 2019 - 2:47:11 AM

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Q. Arnaud. Signals Induced by Charge Carrier Trapping. Journal of Low Temperature Physics, Springer Verlag (Germany), 2014, 176, pp.924-929. ⟨10.1007/s10909-014-1106-8⟩. ⟨in2p3-01066225⟩

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