Recrystallization of hexagonal silicon carbide after gold ion irradiation and thermal annealing

S. Miro 1 Jm. Costantini 2 J. Huguet-Garcia L. Thome 3
1 SRMP - Service de recherches de métallurgie physique
DMN - Département des Matériaux pour le Nucléaire : DEN/DMN
2 SRMA - Service des Recherches Métallurgiques Appliquées
DMN - Département des Matériaux pour le Nucléaire : DEN/DMN
3 CSNSM PCI
CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
Abstract : Silicon carbide (SiC) single crystals with the 6H polytype structure were irradiated with 4.0-MeV Au ions at room temperature (RT) for increasing fluences ranging from 1 x 10(12) to 2 x 10(15)cm(-2), corresponding to irradiation doses from ~0.03 to 5.3 displacements per atom (dpa). The damage build-up was studied by micro-Raman spectroscopy that shows a progressive amorphization by the decrease and broadening of 6H-SiC lattice phonon peaks and the related growth of bands assigned to Si-Si and C-C homonuclear bonds. A saturation of the lattice damage fraction deduced from Raman spectra is found for ~0.8 dpa (i.e. ion fluence of 3 x 10(14)cm(-2)). This process is accompanied by an increase and saturation of the out-of-plane expansion (also for ~0.8 dpa), deduced from the step height at the sample surface, as measured by phase-shift interferometry. Isochronal thermal annealing experiments were then performed on partially amorphous (from 30 to 90%) and fully amorphous samples for temperatures from 200 degrees C up to 1500 degrees C under vacuum. Damage recovery and densification take place at the same annealing stage with an onset temperature of ~200 degrees C. Almost complete 6H polytype regrowth is found for partially amorphous samples (for doses lower than 0.8 dpa) at 1000 degrees C, whereas a residual damage and swelling remain for larger doses. In the latter case, these unrelaxed internal stresses give rise to an exfoliation process for higher annealing temperatures.
Keywords : CRYSTAL GRAIN NUCLEATION AMORPHOUS SIC FILMS DAMAGE ACCUMULATION MOLECULAR-DYNAMICS RAMAN-SCATTERING AMORPHIZATION BEAM CRYSTALLIZATION IMPLANTATION RELAXATION
Type de document :
Article dans une revue
Philosophical Magazine, Taylor & Francis: STM, Behavioural Science and Public Health Titles, 2014, 94 (Issue 34), pp.3898-3913. 〈10.1080/14786435.2014.968230〉
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http://hal.in2p3.fr/in2p3-01097275
Contributeur : Emilie Bonnardel <>
Soumis le : vendredi 19 décembre 2014 - 12:14:18
Dernière modification le : jeudi 7 février 2019 - 15:00:53

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S. Miro, Jm. Costantini, J. Huguet-Garcia, L. Thome. Recrystallization of hexagonal silicon carbide after gold ion irradiation and thermal annealing. Philosophical Magazine, Taylor & Francis: STM, Behavioural Science and Public Health Titles, 2014, 94 (Issue 34), pp.3898-3913. 〈10.1080/14786435.2014.968230〉. 〈in2p3-01097275〉

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