Test beam and clean room studies of ATLAS PPS modules with alternative bias rail geometries

E. Gkougkousis 1 C. Nellist 1 D. Hohov A. Lounis 1 T. Rashid
1 LAL - Laboratoire de l'Accélérateur Linéaire
Abstract : It is known that for the current design of planar pixel sensors, there is a drop of efficiency at the punch-through structure of the biasing system at the edge of pixels. Various geometries, as part of the ATLAS Inner Tracker (ITK) upgrade, are being investigated to reduce this inefficiency. Planar pixel sensors with multiple alternative bias rail geometries have been tested at the SPS beam test facility at CERN in late 2014 with the FE-I4 beam telescope, with results focusing on the efficiency within the pixel. Measurements of the pixel detectors in a clean room before and after irradiation were performed to study the noise for the varied designs. Future plans for further investigations are also discussed.
Type de document :
Communication dans un congrès
26th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, Jun 2015, Santander, Spain
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http://hal.in2p3.fr/in2p3-01174723
Contributeur : Sabine Starita <>
Soumis le : jeudi 9 juillet 2015 - 15:37:40
Dernière modification le : jeudi 11 janvier 2018 - 06:14:21

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  • HAL Id : in2p3-01174723, version 1

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IN2P3 | LAL | UNIV-PARIS-SACLAY

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E. Gkougkousis, C. Nellist, D. Hohov, A. Lounis, T. Rashid. Test beam and clean room studies of ATLAS PPS modules with alternative bias rail geometries. 26th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, Jun 2015, Santander, Spain. 〈in2p3-01174723〉

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