Grenoble Large Scale Facilities for advanced characterisation of microelectronics devices

Abstract : The French IRT-nanoelec consortium in collaboration with GENEPI2 accelerator is offering world unique and complementary techniques for Hirel components characterization. Part of this capability is the high and low (thermal) energy neutron testing of devices.
Type de document :
Poster
Conference on Radiation Effects on Components and Systems (RADECS 2015), Sep 2015, Moscow, Russia. IEEE, Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015, pp.1-4, 2015, 〈http://www.radecs2015.org/〉. 〈10.1109/RADECS.2015.7365616〉
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http://hal.in2p3.fr/in2p3-01192601
Contributeur : Emmanuelle Vernay <>
Soumis le : jeudi 3 septembre 2015 - 10:01:19
Dernière modification le : mardi 22 mai 2018 - 21:48:11

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IN2P3 | LPSC | UGA | LPSC-ACC | CEA | DRT | LETI

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J. Beaucour, J. Segura‐ruiz, B. Giroud, E. Capria, E. Mitchell, et al.. Grenoble Large Scale Facilities for advanced characterisation of microelectronics devices. Conference on Radiation Effects on Components and Systems (RADECS 2015), Sep 2015, Moscow, Russia. IEEE, Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015, pp.1-4, 2015, 〈http://www.radecs2015.org/〉. 〈10.1109/RADECS.2015.7365616〉. 〈in2p3-01192601〉

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