Poster communications
Statistical anomalies of bitflips in SRAMS to discriminate MCUS SEUS
J.A. Clemente
1
F.J. Franco
1
F. Villa
2
M. Baylac
2
S. Rey
2
H. Mecha
1
J.A. Agapito
1
Helmut Puchner
3
G. Hubert
4
R. Velazco
5
G. Hubert 4
Author
R. Velazco 5
Author IdHAL : raoul-velazco
1
UCM - Universidad Complutense de Madrid [Madrid] (Avda. de Séneca, 2, Ciudad Universitaria, 28040 Madrid - Spain)
2
LPSC - Laboratoire de Physique Subatomique et de Cosmologie (53 avenue des Martyrs - 38026 Grenoble Cedex - France)
- UJF - Université Joseph Fourier - Grenoble 1 (BP 53 - 38041 Grenoble Cedex 9 - France)
- Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology (46 avenue Félix Viallet 38031 Grenoble Cedex 1 - France)
- IN2P3 - Institut National de Physique Nucléaire et de Physique des Particules du CNRS (France)
- Institut Polytechnique de Grenoble - Grenoble Institute of Technology (France)
- CNRS - Centre National de la Recherche Scientifique : UMR5821 (France)
3
Cypress Semiconductor [San Jose] (Cypress Semiconductor Corp., 198 Champion Court - San Jose, CA 95134 - United States)
5
TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (46 avenue Félix Viallet
38031 GRENOBLE Cedex 1 - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5159 (France)
- Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology (46 avenue Félix Viallet 38031 Grenoble Cedex 1 - France)
- UJF - Université Joseph Fourier - Grenoble 1 (BP 53 - 38041 Grenoble Cedex 9 - France)
Abstract : This paper presentes an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
Document type :
Poster communications
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http://hal.in2p3.fr/in2p3-01199459
Contributor : Emmanuelle Vernay <>
Submitted on : Tuesday, September 15, 2015 - 2:29:12 PM
Last modification on : Thursday, November 19, 2020 - 3:56:20 PM
Contributor : Emmanuelle Vernay <>
Submitted on : Tuesday, September 15, 2015 - 2:29:12 PM
Last modification on : Thursday, November 19, 2020 - 3:56:20 PM
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- HAL Id : in2p3-01199459, version 1
- DOI : 10.1109/RADECS.2015.7365670
Citation
J.A. Clemente, F.J. Franco, F. Villa, M. Baylac, S. Rey, et al.. Statistical anomalies of bitflips in SRAMS to discriminate MCUS SEUS. Conference on Radiation Effects on Components and Systems (RADECS 2015), Sep 2015, Moscow, Russia. IEEE, Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015), pp.1-4, 2015, ⟨10.1109/RADECS.2015.7365670⟩. ⟨in2p3-01199459⟩
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