Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

I. Jozwik; J. Jagielski; G. Gawlik; G. Panczer; N. Moncoffre; R. Ratajczak; P. Jozwik; A. Wajler; A. Sidorowicz; L. Thomé

Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

I. Jozwik ¹ J. Jagielski G. Gawlik G. Panczer ² N. Moncoffre ³ R. Ratajczak P. Jozwik A. Wajler ¹ A. Sidorowicz L. Thomé ⁴

1 IEMT - Institute of Electronic Materials Technology

2 ILM - Institut Lumière Matière [Villeurbanne]

3 IPNL - Institut de Physique Nucléaire de Lyon

4 CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse

Document type :

Conference papers

Domain :

Chemical Sciences / Material chemistry

Complete list of metadatas

http://hal.in2p3.fr/in2p3-01251362
Contributor : Sylvie Flores <>
Submitted on : Wednesday, January 6, 2016 - 9:54:54 AM
Last modification on : Friday, March 15, 2019 - 2:28:06 PM

Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

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Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

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