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Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

I. Jozwik 1 J. Jagielski G. Gawlik G. Panczer 2 N. Moncoffre 3 R. Ratajczak P. Jozwik A. Wajler 1 A. Sidorowicz L. Thomé 4
1 IEMT - Institute of Electronic Materials Technology
2 ILM - Institut Lumière Matière [Villeurbanne]
3 IPNL - Institut de Physique Nucléaire de Lyon
4 CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse
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Conference papers
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http://hal.in2p3.fr/in2p3-01251362
Contributor : Sylvie Flores <>
Submitted on : Wednesday, January 6, 2016 - 9:54:54 AM
Last modification on : Thursday, October 15, 2020 - 8:54:02 AM

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I. Jozwik, J. Jagielski, G. Gawlik, G. Panczer, N. Moncoffre, et al.. Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials. 19th International Conference on Ion Beam Modification of Materials (IBMM 2014), Sep 2014, Leuven, Belgium. pp.273-277, ⟨10.1016/j.nimb.2015.07.056⟩. ⟨in2p3-01251362⟩

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