Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

I. Jozwik; J. Jagielski; G. Gawlik; G. Panczer; N. Moncoffre; R. Ratajczak; P. Jozwik; A. Wajler; A. Sidorowicz; L. Thomé

doi:10.1016/j.nimb.2015.07.056

Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

I. Jozwik ¹ J. Jagielski G. Gawlik G. Panczer ² N. Moncoffre ³ R. Ratajczak P. Jozwik A. Wajler ¹ A. Sidorowicz L. Thomé ⁴

1 IEMT - Institute of Electronic Materials Technology

2 ILM - Institut Lumière Matière [Villeurbanne]

3 IPNL - Institut de Physique Nucléaire de Lyon

4 CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse

Type de document :

Communication dans un congrès

19th International Conference on Ion Beam Modification of Materials (IBMM 2014), Sep 2014, Leuven, Belgium. 365, pp.273-277, 2015, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 〈10.1016/j.nimb.2015.07.056〉

Domaine :

Chimie / Matériaux

Liste complète des métadonnées

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Contributeur : Sylvie Flores <>
Soumis le : mercredi 6 janvier 2016 - 09:54:54
Dernière modification le : jeudi 15 mars 2018 - 11:40:10

Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

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Ion beam-induced luminescence as method of characterization of radiation damage in polycrystalline materials

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