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Conference papers
Novel technique to study nuclear isomers via atomic processes
Abstract : Nuclear isomers can decay through multiple processes; in many cases the dominant mechanism
is internal conversion (IC). This is an excitation of an atomic-electron resulting in ionization
and the creation of atomic vacancies. These vacancies are propagated towards the outer-shells
by the emission of X-rays and Auger electrons. Auger-electron emission increases the ionic
charge of decaying ions thus affecting the charge-state distribution.
We propose a novel technique to identify and study nuclear isomers by investigating the
charge-state distribution of residual ions following isomeric decays. This technique is based on
the fact that the residual charge-state distribution is sensitive to the internal conversion coefficient
(number of IC events occurring), which could be used to extract useful information about
nuclear isomers.
As a proof of concept, the technique has been applied to study nuclear isomers in 144Cs. The
residual charge-state distribution of 144Cs following isomeric decays has been measured using
the Lohengrin fission fragment mass spectrometer at the Institut Laue-Langevin, France [1].
Based on a level scheme proposed in Ref. [1], we simulated the nuclear cascade decays and the
subsequent emissions of X-rays and Auger electrons in 144Cs using an Auger cascade model
[2]. The simulations started in pre-ionized ions since an equilibrium charge-state distribution
(q - 20) was established after the ions passed through a nickel foil 0.3 mm away from the 235U
target.
The simulation provides very good agreement with the experimental measurement and has
enabled the extraction of a limit on the isomeric lifetime, an isomeric ratio, and deduction of the
unknown level X [1] to be a state at 92.2 keV.
http://hal.in2p3.fr/in2p3-01368271
Contributor : Emmanuelle Vernay <>
Submitted on : Monday, September 19, 2016 - 12:16:58 PM
Last modification on : Monday, July 20, 2020 - 9:18:32 AM
Contributor : Emmanuelle Vernay <>
Submitted on : Monday, September 19, 2016 - 12:16:58 PM
Last modification on : Monday, July 20, 2020 - 9:18:32 AM
