David Hofman, Benoit Sassolas, Christophe Michel, Laurent Balzarini, Laurent Pinard, et al.. Photometric calibration of an in situ broadband optical thickness monitoring of thin films in a large vacuum chamber.
Applied optics, Optical Society of America, 2017, 56, pp.409 - 409.
⟨10.1364/AO.56.000409⟩.
⟨in2p3-01452267⟩