High energy PIXE: A tool to characterize multi-layer thick samples

Abstract : Ka Kb ratio a b s t r a c t High energy PIXE is a useful and non-destructive tool to characterize multi-layer thick samples such as cultural heritage objects. In a previous work, we demonstrated the possibility to perform quantitative analysis of simple multi-layer samples using high energy PIXE, without any assumption on their composition. In this work an in-depth study of the parameters involved in the method previously published is proposed. Its extension to more complex samples with a repeated layer is also presented. Experiments have been performed at the ARRONAX cyclotron using 68 MeV protons. The thicknesses and sequences of a multi-layer sample including two different layers of the same element have been determined. Performances and limits of this method are presented and discussed.
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Submitted on : Wednesday, December 12, 2018 - 9:20:30 AM
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A. Subercaze, C. Koumeir, Vincent Métivier, Noël Servagent, Arnaud Guertin, et al.. High energy PIXE: A tool to characterize multi-layer thick samples. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2018, 417, pp.41-45. ⟨10.1016/j.nimb.2017.09.009⟩. ⟨in2p3-01951159⟩

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