Thick multi-layers analysis using high energy PIXE

Abstract : A method for multi-layer analysis using high energy PIXE is described. It is based on the variation of the Ka Kb ratio as a function of the detection angle. Experiments have been carried out at the ARRONAX cyclotron using 70 MeV protons in order to validate this method. The thicknesses and the sequences of simple multi-layers targets and more complex targets with hidden layers have been determined using this method.
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Submitted on : Wednesday, December 12, 2018 - 9:22:02 AM
Last modification on : Tuesday, September 17, 2019 - 10:30:03 AM

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A. Subercaze, Arnaud Guertin, F. Haddad, C. Koumeir, Vincent Métivier, et al.. Thick multi-layers analysis using high energy PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2017, 406, pp.104-107. ⟨10.1016/j.nimb.2017.02.014⟩. ⟨in2p3-01951320⟩

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