In situ Raman spectroscopy for characterization of irradiation induced defects in graphite

Nicolas Galy 1 N Moncoffre 1 N Toulhoat 2, 1 N. Bérerd 1 Y Pipon 1 M.R. Ammar 3 P. Simon A. Canizares 3 N Raimboux 3 P. Sigot
1 IPNL - Institut de Physique Nucléaire de Lyon
2 CEA-DEN - CEA-Direction de l'Energie Nucléaire
3 CEMHTI - Conditions Extrêmes et Matériaux : Haute Température et Irradiation
Document type :
Poster communications
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http://hal.in2p3.fr/in2p3-02093969
Contributor : Sylvie Flores <>
Submitted on : Tuesday, April 9, 2019 - 1:21:07 PM
Last modification on : Tuesday, November 19, 2019 - 2:39:32 AM

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  • HAL Id : in2p3-02093969, version 1

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Nicolas Galy, N Moncoffre, N Toulhoat, N. Bérerd, Y Pipon, et al.. In situ Raman spectroscopy for characterization of irradiation induced defects in graphite. Nuclear Material conference (NuMat), Oct 2014, Clearwater Beach, United States. ⟨in2p3-02093969⟩

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