In situ Raman spectroscopy for characterization of ion induced defects in model graphite

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Conference papers
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http://hal.in2p3.fr/in2p3-02097721
Contributor : Sylvie Flores <>
Submitted on : Friday, April 12, 2019 - 11:07:03 AM
Last modification on : Wednesday, October 30, 2019 - 1:56:41 AM

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  • HAL Id : in2p3-02097721, version 1

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N. Galy, N. Moncoffre, N Toulhoat, N. Bérerd, Y Pipon, et al.. In situ Raman spectroscopy for characterization of ion induced defects in model graphite. Numat 2018, Oct 2018, Seattle, United States. ⟨in2p3-02097721⟩

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