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Publications du CENBG |  |
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Publications du CENBG | |
| HAL : hal-00023373, version 1 |
| DOI : 10.1016/j.nimb.2005.12.055 |
| Fiche détaillée |  Récupérer au format |
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| Nuclear Instruments and Methods in Physics Research Research Section B: Beam Interactions with Materials and Atoms vol. 246, n° 2 (2006) p. 397-401 |
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| RBS and NRA analyses of lithium inserted amorphous Li1+xNiVO4 films |
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| V. Venkatashamy Reddy1Brigitte Pecquenard1Philippe Vinatier1C. Wannek1Alain Levasseur1P. Moretto2 |
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| (2006) |
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| rf-Magnetron sputtered LiNiVO4 thin film was used as a negative electrode for lithium microbatteries applications. Their film composition and thickness were analyzed by Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA) technique by using 4He+, 7Li(p α) 4He reaction respectively. The structure, surface roughness and homogeneity of these films have been investigated by X-ray diffraction (XRD), atomic force microscopy (AFM) and auger electron spectroscopy (AES) techniques. The amount of lithium inserted into the LiNiVO4 films was analyzed by RBS and NRA studies. The results are comparable to those obtained from the electro-analytical technique (galvanostatic method), indicating that ion beam techniques are complementary tools for the analysis of lithium metal oxide thin films. |
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| 1 : | ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux |
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| 2 : | CENBG - Centre d'Etudes Nucléaires de Bordeaux Gradignan |
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| Domaine | : | Chimie/Matériaux |
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| RBS – NRA – LiNiVO4 films – Li-insertion |
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| hal-00023373, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00023373 | |
| oai:hal.archives-ouvertes.fr:hal-00023373 | |
| Contributeur : Stéphane Toulin | |
| Soumis le : Mardi 25 Avril 2006, 15:30:33 | |
| Dernière modification le : Lundi 7 Juillet 2008, 09:59:26 | |
