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Study of the X-ray scattering in the silicon and CdTe XPAD
Medjoubi K., Hustache S., Mercère P., Ravy S., Clemens J.C. et al
14th International Workshop on Radiation Imaging Detectors (iwoRID2012, Coimbra : Portugal (2012) - http://hal.in2p3.fr/in2p3-00718137
Sciences de l'ingénieur/Electronique
Sciences du Vivant/Ingénierie biomédicale
Study of the X-ray scattering in the silicon and CdTe XPAD
K. Medjoubi1, S. Hustache1, P. Mercère1, S. Ravy1, J.C. Clemens2, J.F. Bérar3, N. Boudet3, B. Dinkespiler4, A. Dawiec4, P. Delpierre ()4
1 :  SSOLEIL - Synchrotron SOLEIL
http://www.synchrotron-soleil.fr
CNRS : UR1
L'Orme des Merisiers Saint-Aubin - BP 48 91192 GIF-sur-YVETTE CEDEX
France
2 :  CPPM - Centre de Physique des Particules de Marseille
http://marwww.in2p3.fr/
CNRS : UMR7346 – IN2P3 – Université de la Méditerranée - Aix-Marseille II
163, avenue de Luminy - Case 902 - 13288 Marseille cedex 09
France
3 :  NEEL - Institut Néel
http://www.neel.cnrs.fr/
CNRS : UPR2940 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG)
25 avenue des Martyrs - BP 166 38042 GRENOBLE CEDEX 9
France
4 :  imXPAD - IMXPAD
IMXPAD
297 Avenue de l' espace MISTRAL BAT A 13600 LA CIOTAT
France
CRG
IMXPAD
The XPAD3, a photon counting hybrid pixel detector developed in collaboration by SOLEIL Synchrotron, the Institut Néel and the Centre de Physique des Particules de Marseille (CPPM) [1], is now successfully used for a large variety of X-ray experiments on third generation synchrotron light sources [2]. Several 7.3 cm x 12.5 cm imagers composed of 8 silicon modules (7 chips per module, 9600 pixel of 130μm side per chip) are routinely used on different synchrotron beamlines at Soleil and on the CRG beamline D2AM at ESRF. Detector performances such as noiseless detection, high dynamic (27 bits) and fast framing rate (640 fps) have opened up the possibility of new or improved types of measurements. Nevertheless, above 15 keV, besides the loss of efficiency [2], the X-ray scattering in silicon sensor and the material located behind significantly increases the shape and the width of thepoint-spread function at 0.01% of the maximum. This effect prevents the study of low intensity phenomena such as diffuse scattering, which would be observed at the foot of theBragg peak and theoretically measurable with the large dynamic of the detector. This effect has been measured at different energies with monochromatic synchrotron beam (on CRISTAL and METROLOGIE Soleil beamlines) on a mono module Silicon XPAD and then compared with a Quad CdTe XPAD prototype (cf. figure 1). The results, which will be presented, demonstrate the superiority of the high Z sensor and push the investigation of the CdTe as a material sensor even at mid energy.

Communications sans actes
03/07/2012

14th International Workshop on Radiation Imaging Detectors (iwoRID2012
Coimbra
Portugal
01/07/2012
05/07/2012
P. Delpierre