245 articles – 3647 Notices  [english version]
.:. Consultation > Par auteurs du labo > Zheng .:.
9 documents classés par :

Implantation, desordre et precipitation dans un semiconducteur III-V (InP); Formation de couches epitaxiees par implantation dans Ti et TiAl: Etude par microscopie electronique en transmission in situ
Zheng P.
Université Paris Sud - Paris XI (1991) [in2p3-00002775 - version 1]
Temperature influence on the damage induced in Si$^+$ -implanted InP
Zheng P., Ruault M.O., Gasgnier M., Descouts B., Krauz P.
Journal of Applied Physics 70 (1991) 752-757 [in2p3-00001053 - version 1]
In situ thermal annealing of InP amorphous layer induced by Si$^+$ implantation
Zheng P., Ruault M.O., Denanot M.F., Descouts B., Krautz P.
Journal of Applied Physics 69 (1991) 197-202 [in2p3-00001036 - version 1]
High resolution electron microscopy study of damage created in Si-implanted InP
Zheng P., Ruault M.O., Pitaval M., Descouts B., Krauz P. et al
Applied Physics Letters 59 (1991) 1594-1596 [in2p3-00001033 - version 1]
In situ defect studies on Si$^+$ implanted InP
Zheng P., Ruault M.O., Kaitasov O., Crestou J., Descouts B. et al
Journal of Physics D 23 (1990) 877-883 [in2p3-00001081 - version 1]
Hydride epitaxy during implant of H$^+$ in Ti
Zheng P., Ruault M.O., Fournier D., Saint Jacques R.G.
Journal of Materials Science Letters 9 (1990) 75-77 [in2p3-00001080 - version 1]
Structure of boride films formed by ion implantation into titanium
Pivin J.C., Zheng P., Ruault M.O.
Philosophical Magazine Letters 59 (1989) 25-30 [in2p3-00002042 - version 1]
Transmission electron microscopy investigation of the structural transformations in titanium or TiAl implanted with nitrogen, carbon, oxygen and boron
Pivin J.C., Zheng P., Ruault M.O.
Dans Materials Science and Engineering - International Conference on Surface Modification of Metals by Ion Beams 6, Italie [in2p3-00001305 - version 1]
Epitaxial growth of nitrides in Ti implanted with N
Zheng P., Pivin J.C., Ruault M.O.
Europhysics Letters (EPL) 8 (1988) 689-694 [in2p3-00001315 - version 1]