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430 Documents classés par : 
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Towards a parametrization of multiparticle hadronic reactions
Giffon M., Hama Y., Predazzi E.
Il Nuovo Cimento A 57 (1980) 397-426 [in2p3-00009694 - version 1]
The configuration d$^N$ in cubic symmetry : a symmetry adapted weak field approach
Kibler M., Grenet G.
Dans Group Theoretical Methods in Physics - International Colloquium on Group Theoretical Methods in Physics 9, Mexique [in2p3-00003937 - version 1]
On some special relations involving 3-jm symbols
Cazeau J.-P., Kibler M.
Dans Group Theoretical Methods in Physics - International Colloquium on Group Theoretical Methods in Physics 9, Mexique [in2p3-00003936 - version 1]
A high current ion implanter with hybrid scanning
Camplan J., Chaumont J., Meunier R., Graber R., Rouge J.C. et al
Nuclear Instruments and Methods in Physics Research Research 171 (1980) 245-250 [in2p3-00003832 - version 1]
Niveaux de spin eleve dans le $^(63)$Cu etat isomerique yrast $\frac(17)(2)+$
Ung Chan T., Bruandet J.F., Chambon B., Dauchy A., Drain D. et al
Nuclear Physics A 348 (1980) 179-199 [in2p3-00014847 - version 1]
Contribution a l'etude des flux d'ions de faible energie (1 MeV) dans le rayonnement solaire contemporain et ancien
Borg J.
Université Paris Sud - Paris XI (1980) [in2p3-00002855 - version 1]
Interpretation photometrique de notre galaxie et des nuages de Magellan
Vaugiani-Flam E.
Université Pierre et Marie Curie - Paris VI (1980) [in2p3-00002851 - version 1]
Temporal variations in cosmogenic $^(10)$Be production: implication for radiocarbon
Raisbeck G.M., Yiou F.
Radiocarbon 22 (1980) 245-249 [in2p3-00002634 - version 1]
Transmission electron microscope investigations of defects produced by individual displacement cascades in Si and Ge
Ruault M.O., Jager W.
Dans Journal of Microscopy - Microscopy of Semiconducting Materials, Royaume-Uni [in2p3-00002169 - version 1]
Oxidation of nickel base alloys flooded with oxygen under ionic bombardment
Pivin J.C., Roques-Carmes C., Slodzian G.
Dans Secondary Ion Mass Spectrometry SIMS-II Proceedings of the Second International Conference - International Conference on Secondary Ion Mass Spectrometry 2 SIMS-II, États-Unis [in2p3-00002167 - version 1]