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Density muon radiography of La Soufrière of Guadeloupe volcano: comparison with geological, electrical resistivity and gravity data
Lesparre N., Gibert D., Marteau J., Komorowski J.-C., Nicollin F. et al
Geophysical Journal International 190, 2 (2012) 1008-1019 [insu-00814387 - version 1]
fulltext access Design and operation of a field telescope for cosmic ray geophysical tomography
Lesparre N., Marteau J., Déclais Y., Gibert D., Carlus B. et al
Geoscientific Instrumentation Methods and Data Systems 1 (2012) 33-42 [insu-00814367 - version 1]
Optical spectroscopy study of damage induced in 4H-SiC by swift heavy ion irradiation
Sorieul S., Kerbiriou X., Costantini J.-M., Gosmain L., Calas G. et al
J. Phys.: Condens. Matter 24 (2012) 125801 [hal-00790546 - version 1]
High Spatial Resolution Chemical Imaging of Inorganic and Organometallic Pesticides
Ortega R., Carmona A.
Journal of Environmental & Analytical Toxicology 4 (2012) 005 [in2p3-00776225 - version 1]
Special issue on toxicology of pesticides
Sánchez-Bayo F., Ortega R.
Journal of Environmental & Analytical Toxicology s4 (2012) e001 [in2p3-00776218 - version 1]
Readout architecture based on the use of Silicon PhotoMultiplier (SiPM, or MMPC)
Marteau J., Carlus B., Gardien S., Girerd C., Ianigro J.-C. et al
Dans Geophysical Research Abstracts - EGU General Assembly 2012, Autriche (2012) [insu-00761264 - version 1]
Density Muon Radiography of Soufrière of Guadeloupe Volcano: Comparison with Geological, Electrical Resistivity and Seismic data
Gibert D., Lesparre N., Marteau J., Komorowski J.-C., Nicollin F. et al
Dans Geophysical Research Abstracts - EGU General Assembly 2012, Autriche (2012) [insu-00761250 - version 1]
Readout architecture for sub-nanosecond resolution TDC
Marteau J., Carlus B., Gardien S., Girerd C., Ianigro J.-C. et al
Dans Geophysical Research Abstracts - EGU General Assembly 2012, Autriche (2012) [insu-00761240 - version 1]
Revised chronology of the youngest volcanoes of the Chaine des Puys (French Massif Central)
Miallier D., Pilleyre T., Sanzelle S., Boivin P., Lanos P.
Quaternaire 23 (2012) 283-290 [in2p3-00757318 - version 1]
Recrystallization of amorphous ion implanted silicon carbide after thermal annealing
Miro S., Costantini J.-M., Sorieul S., Gosmain L., Thomé L.
Philosophical Magazine Letters 92 (2012) 633-639 [in2p3-00739573 - version 1]