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Effects of angular momentum alignment on the properties of collective bands in atomic nuclei
Mikhailov I.N., Balbutsev E.B., Briancon C.
In Lectures of the 1982 International Summer School of Nuclear Physics - International Summer School of Nuclear Physics, Romania [in2p3-00001692 - version 1]
Use of ion beam techniques for studying the leaching properties of lead implanted silicates
Della Mea G., Dran J.C., Petit J.C., Bezzon G., Rossi-Alvarez C.
Dans Nuclear Instruments and Methods in Physics Research - International Conference on Ion Beam Analysis 6 Iba-6, États-Unis [in2p3-00001646 - version 1]
Phenomenes d'irradiations dans les metaux
Ruault M.O.
Dans Microscopie electronique en science des materiaux - Cours de l'Ecole de Microscopie Electronique en Science des Materiaux, France [in2p3-00001631 - version 1]
Accelerator mass spectrometry with $^(26)$Al
Middleton R., Klein J., Raisbeck G.M., Yiou F.
Dans Nuclear Instruments and Methods in Physics Research - International Conference on Ion Beam Analysis 6 Iba-6, États-Unis [in2p3-00001515 - version 1]
Transmission electron microscopy study of ion implantation induced Si amorphization
Ruault M.O., Chaumont J., Bernas H.
Dans Nuclear Instruments and Methods in Physics Research - International Conference on Ion Beam Modification of Materials 3, France [in2p3-00001502 - version 1]
Production and stability of implanted PdSi hydride
Traverse A., Mendoza-Zelis L., Bernas H., Chaumont J., Thome L.
Dans Nuclear Instruments and Methods in Physics Research - International Conference on Ion Beam Modification of Materials 3, France [in2p3-00001485 - version 1]
Evidence for implantation-induced impurity diffusion in metals
Thome L., Chaumont J., Traverse A., Bernas H., Cohen C. et al
Dans Nuclear Instruments and Methods in Physics Research - International Conference on Ion Beam Modification of Materials 3, France [in2p3-00001477 - version 1]
fulltext access STUDY OF SOME OPTICAL AND ELECTRICAL PROPERTIES OF HEAVILY DOPED SILICON LAYERS
Slaoui A., Fogarassy E., Muller J., Siffert P.
in Journal de Physique Colloques - Laser-Solid Interactions and Transient Thermal Processing of Materials, France (1983) [jpa-00223089 - version 1]
fulltext access DEPTH MEASUREMENT OF THE PHASE CHANGE UNDER PULSED RUBY LASER ANNEALING
Toulemonde M., Heddache R., Nielsen F., Siffert P.
in Journal de Physique Colloques - Laser-Solid Interactions and Transient Thermal processing of Materials, France (1983) [jpa-00223093 - version 1]
fulltext access PULSED ELECTRON BEAM ANNEALING OF As AND B IMPLANTED SILICON
Barbier D., Chemisky G., Grob J., Laugier A., Siffert P. et al
Dans Journal de Physique Colloques - Congress on Laser-Solid Interactions and Transient Thermal Processing of Materials, France (1983) [jpa-00223118 - version 1]