1061 articles – 5064 Notices  [english version]
HAL : in2p3-00747236, version 1

Fiche concise  Récupérer au format
SPIROC: Design and Performance of a Dedicated Very Front-End for an ILC Prototype Hadronic Calorimeter with SiPM
Raux L., Callier S., Conforti Di Lorenzo S., Dulucq F., de La Taille C. et al
Dans Proceedings of the Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - 2012 Nuclear Science Symposium, Medical Imaging Conference and 19th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (2012 IEEE NSS/MIC/RTSD), Anaheim : États-Unis (2012) - http://hal.in2p3.fr/in2p3-00747236
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
SPIROC: Design and Performance of a Dedicated Very Front-End for an ILC Prototype Hadronic Calorimeter with SiPM
L. Raux1, S. Callier1, S. Conforti Di Lorenzo1, F. Dulucq1, C. de La Taille1, G. Martin-Chassard1, N. Seguin-Moreau1
1 :  LAL - Laboratoire de l'Accélérateur Linéaire
http://www.lal.in2p3.fr/
CNRS : UMR8607 – IN2P3 – Université Paris XI - Paris Sud
Centre Scientifique d'Orsay B.P. 34 91898 ORSAY Cedex
France
Omega
The SPIROC chip is a dedicated very front-end electronics to read out a prototype of the Analog Hadronic Calorimeter equipped with Silicon Photomultiplier (SiPM) for ILC (International Linear Collider). A first prototype of SPIROC has been fabricated in 2007 and a second version in 2010. Many test bench and test beam measurements have been performed showing a good overall behaviour. However some limitations have been encountered. Another version has been submitted in February 2012 to correct these limitations and to improve the ASIC performances. After an exhaustive description of the ASIC, the performances will be presented in this paper.

Communications avec actes
2012
29/10/2012
Proceedings of the Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
internationale
557-561
IEEE

2012 Nuclear Science Symposium, Medical Imaging Conference and 19th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (2012 IEEE NSS/MIC/RTSD)
Anaheim
États-Unis
27/10/2012
03/11/2012
L. Raux

LAL/RT 12-26