45 articles – 154 Notices  [english version]
.:. Consultation > Par domaine arXiv > Sciences de l'ingénieur .:.
10 documents classés par :

Croissance de films minces métalliques complexes : expériences et simulations
Thomann A.-L., Brault P., Xie L., Hidalgo H., Dolique V. et al
Journées Surfaces et Interfaces, France (2013) [hal-01058524 - version 1]
Bulk optical absorption of high resistivity silicona at 1550 nm
Degallaix J., Flaminio R., Forest D., Granata M., Michel C. et al
Optics Letters 38 (2013) 2047-2049 [in2p3-00919931 - version 1]
Cryogenic measurements of mechanical loss of high-reflectivity coating and estimation of thermal noise
Granata M., Craig K., Cagnoli G., Carcy C., Cunningham W. et al
Optics Letters 38 (2013) 5268-5271 [in2p3-00919923 - version 1]
fulltext access IR emission from the target during plasma magnetron sputter deposition
Cormier P.-A., Thomann A.-L., Dolique V., Balhamri A., Dussart R. et al
Thin Solid Films 545 (2013) 44-49 [in2p3-00874718 - version 1]
Submicrometric gratings fabrication from photosensitive organo-silica-hafnia thin films elaborated by sol-gel processing
Franc J., Barnier V., Vocanson F., Gamet E., Lesage M. et al
Thin Solid Films 520, 19 (2012) 6050 [ujm-00681960 - version 1]
Toward a new generation of low-loss mirrors for the advanced gravitational waves interferometers
Pinard L., Sassolas B., Flaminio R., Forest D., Lacoudre A. et al
Optics Letters 36 (2011) 1407-1409 [in2p3-00623950 - version 1]
fulltext access Masking technique for coating thickness control on large and strongly curved aspherical optics
Sassolas B., Flaminio R., Franc J., Michel C., Montorio J.-L. et al
Applied Optics 46 (2009) 3760-3765 [in2p3-00418223 - version 1]
fulltext access Experimental optomechanics with silicon micromirrors
Arcizet O., Molinelli C., Briant T., Cohadon P.-F., Heidmann A. et al
New Journal of Physics 10 (2008) 125021 [in2p3-00347257 - version 1]
In-vacuum optical isolation changes by heating in a Faraday isolator
Acernese F., Alshourbagy M., Amico P., Antonucci F., Aoudia S. et al
Applied Optics 47 (2008) 5853-5861 [in2p3-00346825 - version 1]
Amorphous semiconductor thin films characterization by nuclear microanalysis
Thomas J.-P., Fallavier M., Mackowski J.-M., Pijolat C., Tousset J. et al
Journal of Radioanalytical Chemistry 55, 2 (1980) 427-443 [emse-00436105 - version 1]