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Rayleigh scattering, absorption, and birefringence of large-size bulk single-crystal sapphire
Yan Z., Ju L., Zhao C., Gras S., Blair D.G. et al
Applied Optics 45 (2006) 2631-2637 - http://hal.in2p3.fr/in2p3-00077641
Physique/Matière Condensée/Science des matériaux
Physique/Physique/Optique
Rayleigh scattering, absorption, and birefringence of large-size bulk single-crystal sapphire
Z. Yan, Li Ju, C. Zhao, S. Gras, D.G. Blair, M. Tokunari, K. Kuroda, J.-M. Mackowski1, A. Remillieux1
1 :  LMA - Laboratoire des matériaux avancés
CNRS : USR3264 – IN2P3 – Université Claude Bernard - Lyon I (UCBL)
Bâtiment 213 VIRGO 22 7 avenue Pierre de Coubertin 69622 VILLEURBANNE CEDEX
France
While the thermomechanical properties of sapphire make it an excellent candidate of test mass for advanced laser interferometers, its optical quality is not well understood or well controlled. We have studied the results from high-resolution measurements of scattering, absorption, and birefringence in test-mass samples to better understand issues of quality. Samples show large-scale scattering structures clearly linked to the crystal-growth process. Samples characterized by the presence of point defects have significantly lower scattering (except at the point defects). In general on a large scale, high scattering also correlates with higher absorption and higher average birefringence inhomogeneity. However, on a smaller scale there is not a clear point-to-point correlation between scattering and absorption. Often a large-scale scattering structure is spatially displaced by tens of millimeters from a similar absorption structure, indicating that quite separate microscopic mechanisms give rise to scattering and absorption. The spatial displacements indicate that absorption centers and scattering centers are laid down during crystal growth at different distances from the solid-liquid interface. We suggest that absorption may be linked to F centers, while scattering may be linked to impurities such as iron.

Articles dans des revues avec comité de lecture
2006
Applied Optics (Appl Opt)
Publisher Optical Society of America
ISSN 0003-6935 (eISSN : 1539-4522)
45
2631-2637

Imaging systems : Image detection systems – Instrumentation – measurement – and metrology : Optical inspection – and metrology : Phase measurement – and metrology : Scattering measurements – Materials : Optical materials – Materials : Optical properties – Physical optics : Birefringence – Scattering : Scattering measurements