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Radiation and Effects on Components and Systems Workshop (RADECS'04), Madrid : Espagne (2004)
Validating a dynamic signature monitoring approach using the LTL model checking technique
B. Nicolescu1, 2, N. Gorse3, B.Y. Savaria1, E.M. Aboulhamid3, R. Velazco4
(2004)

Consequences of transient errors represent a significant problem for today’s electronic circuits and systems. As the probability of such errors increases, incorporation of error detection and correction mechanisms is a major concern. This represents one of the major industry focuses. An important challenge is that traditional validation techniques do not cover the whole spectrum of single bit-flip fault scenarios. In this paper, a new signature analysis method is proposed. This technique was previously validated using simulation-based fault injection. This validation showed that no errors escape detection. In addition, we explore a verification approach based on model-checking targeting complete validation. It presents a fundamental advantage over classic fault-injection techniques: it covers all possible single bit-flip fault scenarios. Experimental results illustrate the effeciency of this validation approach over usual simulation-based techniques.
1 :  EPM - Ecole Polytechnique de Montreal
2 :  LPNHE - Laboratoire de Physique Nucléaire et de Hautes Énergies
3 :  DIRO - Département d'Informatique et de Recherche Opérationnelle [Montreal]
4 :  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
transient-errors