HAL : in2p3-00137684, version 1

DOI : 10.1080/00150190600962176

Fiche détaillée

Récupérer au format BibTeX - EndNote - TEI - RefWorks -

Ferroelectrics 343 (2006) 101-110

X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase

F. Goc1, 2, C. Blanc1, 2, V. Lorman1, 2, M. Nobili1, 2, S. Samaritani, G. Galli, W. Kuczynacuteski

(2006)

We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [1] with a de Vries-type behavior. In a wide temperature range (b.Delta T sim 50°C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.

1 :	LCVN - Laboratoire des colloïdes, verres et nanomatériaux
2 :	LPTA - Laboratoire de Physique Théorique et Astroparticules

Thème(s)

:

Physique/Matière Condensée/Science des matériaux

Mot(s)-clé(s) : de Vries – smectic A* phase – X-ray – optics – electrooptics

in2p3-00137684, version 1

http://hal.in2p3.fr/in2p3-00137684

oai:hal.in2p3.fr:in2p3-00137684

Contributeur : Dominique Girod <>

Soumis le : Mercredi 21 Mars 2007, 11:50:43

Dernière modification le : Mercredi 21 Mars 2007, 11:52:06