Amorphous semiconductor sample preparation for transmission EXAFS measurements - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Year : 1998

Amorphous semiconductor sample preparation for transmission EXAFS measurements

M.C. Ridgway
  • Function : Author
C.J. Glover
  • Function : Author
H.H. Tan
  • Function : Author
A. Clark
  • Function : Author
F. Karouta
  • Function : Author
G.J. Foran
  • Function : Author
T.W. Lee
  • Function : Author
Y. Moon
  • Function : Author
E. Yoon
  • Function : Author
J.L. Hansen
  • Function : Author
A. Nylandsted-Larsen
  • Function : Author
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Dates and versions

in2p3-00003776 , version 1 (12-01-2000)

Identifiers

  • HAL Id : in2p3-00003776 , version 1

Cite

M.C. Ridgway, C.J. Glover, H.H. Tan, A. Clark, F. Karouta, et al.. Amorphous semiconductor sample preparation for transmission EXAFS measurements. Applications of Synchrotron Radiation Techniques to Materials Science 4, Apr 1998, San Francisco, United States. pp.309-314. ⟨in2p3-00003776⟩
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