Hydrogen depth profile in sputtered Cu$_x$Zr$_{1-x}$ amorphous alloys studied by nuclear reaction analysis evolution as a function of annealing temperature - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Solid State Communications Year : 1986

Hydrogen depth profile in sputtered Cu$_x$Zr$_{1-x}$ amorphous alloys studied by nuclear reaction analysis evolution as a function of annealing temperature

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in2p3-00004091 , version 1 (10-03-2000)

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  • HAL Id : in2p3-00004091 , version 1

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M. Fallavier, J.-P. Thomas, J.M. Frigerio, J. Rivory. Hydrogen depth profile in sputtered Cu$_x$Zr$_{1-x}$ amorphous alloys studied by nuclear reaction analysis evolution as a function of annealing temperature. Solid State Communications, 1986, 57, pp.59-61. ⟨in2p3-00004091⟩
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