Electron-impact ionization and energy loss of 27 MeV/u Xe$^{35}$ incident ions channeled in silicon - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Physical Review Letters Year : 1989

Electron-impact ionization and energy loss of 27 MeV/u Xe$^{35}$ incident ions channeled in silicon

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in2p3-00004207 , version 1 (20-03-2000)

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S. Andriamonje, R. Anne, N.V. De Castro Faria, M. Chevallier, C. Cohen, et al.. Electron-impact ionization and energy loss of 27 MeV/u Xe$^{35}$ incident ions channeled in silicon. Physical Review Letters, 1989, 63, pp.1930-1933. ⟨10.1103/PhysRevLett.63.1930⟩. ⟨in2p3-00004207⟩
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