Apport de la technique TOF-PDMS à l'étude de la phosphatation des aciers fer-silicium - IN2P3 - Institut national de physique nucléaire et de physique des particules Accéder directement au contenu
Communication Dans Un Congrès Année : 1996

Apport de la technique TOF-PDMS à l'étude de la phosphatation des aciers fer-silicium

Résumé

(N)Ict's invaded the class and the university since nation-wide plans have disseminated technology in France as in other countries of the world, whatever their level of development. The attention is generally focused on these changes in the institution. But another deeper factor and less studied is the impact of Ict's on the younger generations which were born with these "new technologies" in their cradle (i.e. the mobile plays vidéos, simulation games, telephones with their sms and mms, numerical photographs, computers, the Internet and its flood of musics and networked plays, e-amils and surfing. The defended assumption is that the intensive exposure of young people to the objects of the (n)Ict's is one of the key factor both of the Flynn effect (general increase in the IQ and the request for intellectual stimulation) and of the world-wide crisis of education. It is proposed that one of the ways of resolution of this crisis passes by the appropriation of the culture of the Cyberspace by the education systems. If admittedly technology has some perverse effects on education and the culture, one should at least seek to exploit its potentialities through a renwed pedagogical project.
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Dates et versions

in2p3-00004707 , version 1 (07-04-2000)

Identifiants

  • HAL Id : in2p3-00004707 , version 1

Citer

H. Allali, M. Ben Marek, O. Debré, B. Nsouli, A. Oladipo, et al.. Apport de la technique TOF-PDMS à l'étude de la phosphatation des aciers fer-silicium. Journées Française de Spectrométrie de Masse 13, Sep 1996, Orléans, France. ⟨in2p3-00004707⟩
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