Journal Articles
Journal of Applied Physics
Year : 1991
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https://hal.in2p3.fr/in2p3-00004931
Submitted on : Friday, June 16, 2000-2:57:02 PM
Last modification on : Friday, June 2, 2023-3:36:26 PM
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- HAL Id : in2p3-00004931 , version 1
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M.C. Busch, A. Slaoui, P. Siffert, E. Dooryhee, M. Toulemonde. Structural and electrical damage induced by high-energy heavy ions in SiO$_{2}$/Si structures. Journal of Applied Physics, 1991, 71, pp.2596-2601. ⟨in2p3-00004931⟩
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