Statistical description of stongly damped binary yields from the $^{28}$Si + $^{16}$O reaction

A. Szanto de Toledo; S.J. Sanders; C. Beck

Journal articles

Statistical description of stongly damped binary yields from the $^{28}$Si + $^{16}$O reaction

A. Szanto de Toledo S.J. Sanders C. Beck ¹

1 IReS - Institut de Recherches Subatomiques

Document type :

Journal articles

Domain :

Physics [physics] / Nuclear Experiment [nucl-ex]

Complete list of metadata

http://hal.in2p3.fr/in2p3-00005606
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Monday, July 17, 2000 - 3:55:18 PM
Last modification on : Tuesday, November 30, 2021 - 8:32:04 AM

Statistical description of stongly damped binary yields from the $^{28}$Si + $^{16}$O reaction

Identifiers

Collections

Citation

Export

Metrics

2

Statistical description of stongly damped binary yields from the $^{28}$Si + $^{16}$O reaction

Identifiers

Collections

Citation

Export

Share

Metrics

2